Follow
John Dell
Title
Cited by
Cited by
Year
Effect of deposition conditions on mechanical properties of low-temperature PECVD silicon nitride films
H Huang, KJ Winchester, A Suvorova, BR Lawn, Y Liu, XZ Hu, JM Dell, ...
Materials Science and Engineering: A 435, 453-459, 2006
2442006
Scattering mechanisms limiting two-dimensional electron gas mobility in modulation-doped field-effect transistors
J Antoszewski, M Gracey, JM Dell, L Faraone, TA Fisher, G Parish, YF Wu, ...
Journal of Applied Physics 87 (8), 3900-3904, 2000
1612000
Widely tunable MEMS-based Fabry–Perot filter
JS Milne, JM Dell, AJ Keating, L Faraone
Journal of microelectromechanical systems 18 (4), 905-913, 2009
1502009
/sup 60/Co gamma irradiation effects on n-GaN Schottky diodes
GA Umana-Membreno, JM Dell, G Parish, BD Nener, L Faraone, ...
IEEE Transactions on Electron Devices 50 (12), 2326-2334, 2003
1302003
MEMS-based microspectrometer technologies for NIR and MIR wavelengths
LP Schuler, JS Milne, JM Dell, L Faraone
Journal of Physics D: Applied Physics 42 (13), 133001, 2009
1242009
Nanoscratch-induced phase transformation of monocrystalline Si
YQ Wu, H Huang, J Zou, LC Zhang, JM Dell
Scripta Materialia 63 (8), 847-850, 2010
1002010
Determination of mechanical properties of PECVD silicon nitride thin films for tunable MEMS Fabry–Perot optical filters
H Huang, K Winchester, Y Liu, XZ Hu, CA Musca, JM Dell, L Faraone
Journal of Micromechanics and Microengineering 15 (3), 608, 2005
972005
Monolithic integration of an infrared photon detector with a MEMS-based tunable filter
CA Musca, J Antoszewski, KJ Winchester, AJ Keating, T Nguyen, K Silva, ...
IEEE electron device letters 26 (12), 888-890, 2005
872005
60Co gamma-irradiation-induced defects in
GA Umana-Membreno, JM Dell, TP Hessler, BD Nener, G Parish, ...
Applied physics letters 80 (23), 4354-4356, 2002
872002
Tunable Fabry-Pérot cavities fabricated from PECVD silicon nitride employing zinc sulphide as the sacrificial layer
KJ Winchester, JM Dell
Journal of Micromechanics and Microengineering 11 (5), 589, 2001
792001
HgCdTe mid-wavelength IR photovoltaic detectors fabricated using plasma induced junction technology
JM Dell, J Antoszewski, MH Rais, C Musca, JK White, BD Nener, ...
Journal of Electronic Materials 29, 841-848, 2000
762000
Quantifying the effects of 16p11. 2 copy number variants on brain structure: a multisite genetic-first study
S Martin-Brevet, B Rodríguez-Herreros, JA Nielsen, C Moreau, ...
Biological Psychiatry 84 (4), 253-264, 2018
752018
Magnetic field dependent Hall data analysis of electron transport in modulation-doped AlGaN/GaN heterostructures
Z Dziuba, J Antoszewski, JM Dell, L Faraone, P Kozodoy, S Keller, ...
Journal of applied physics 82 (6), 2996-3002, 1997
681997
Characterization of Hg0.7Cd0.3Te n- on p-type structures obtained by reactive ion etching induced p- to n conversion
J Antoszewski, CA Musca, JM Dell, L Faraone
Journal of Electronic materials 29, 837-840, 2000
642000
Stress in low-temperature plasma enhanced chemical vapour deposited silicon nitride thin films
M Martyniuk, J Antoszewski, CA Musca, JM Dell, L Faraone
Smart Materials and Structures 15 (1), S29, 2005
632005
GaSb: a new alternative substrate for epitaxial growth of HgCdTe
W Lei, RJ Gu, J Antoszewski, J Dell, L Faraone
Journal of electronic materials 43, 2788-2794, 2014
622014
Nanoscratch-induced deformation of single crystal silicon
YQ Wu, H Huang, J Zou, JM Dell
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2009
612009
Generation-recombination effects on dark currents in CdTe-passivated midwave infrared HgCdTe photodiodes
A Jozwikowska, K Jozwikowski, J Antoszewski, CA Musca, T Nguyen, ...
Journal of applied physics 98 (1), 2005
532005
Poisson's ratio of low-temperature PECVD silicon nitride thin films
BA Walmsley, Y Liu, XZ Hu, MB Bush, JM Dell, L Faraone
Journal of Microelectromechanical Systems 16 (3), 622-627, 2007
522007
MBE growth of mid-wave infrared HgCdTe layers on GaSb alternative substrates
W Lei, RJ Gu, J Antoszewski, J Dell, G Neusser, M Sieger, B Mizaikoff, ...
Journal of Electronic Materials 44, 3180-3187, 2015
492015
The system can't perform the operation now. Try again later.
Articles 1–20