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Franz J. Giessibl
Franz J. Giessibl
University of Regensburg, NIST, U Augsburg, McKinsey, Park Sci. Instrum., IBM Research, LMU, ETHZ
Verified email at ur.de
Title
Cited by
Cited by
Year
Springer handbook of nanotechnology
B Bhushan
Springer, 2017
39062017
Advances in atomic force microscopy
FJ Giessibl
Reviews of modern physics 75 (3), 949, 2003
31462003
Atomic resolution of the silicon (111)-(7× 7) surface by atomic force microscopy
FJ Giessibl
Science 267 (5194), 68-71, 1995
16231995
Noncontact Atomic Force Microscopy: Volume 3
S Morita, FJ Giessibl, E Meyer, R Wiesendanger
Springer, 2015
10892015
Forces and frequency shifts in atomic-resolution dynamic-force microscopy
FJ Giessibl
Physical Review B 56 (24), 16010, 1997
9401997
High-speed force sensor for force microscopy and profilometry utilizing a quartz tuning fork
FJ Giessibl
Applied physics letters 73 (26), 3956-3958, 1998
7971998
Atomic resolution on by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork
FJ Giessibl
Applied Physics Letters 76 (11), 1470-1472, 2000
7032000
The force needed to move an atom on a surface
M Ternes, CP Lutz, CF Hirjibehedin, FJ Giessibl, AJ Heinrich
Science 319 (5866), 1066-1069, 2008
5362008
Subatomic features on the silicon (111)-(7× 7) surface observed by atomic force microscopy
FJ Giessibl, S Hembacher, H Bielefeldt, J Mannhart
Science 289 (5478), 422-425, 2000
5332000
Measuring the charge state of an adatom with noncontact atomic force microscopy
L Gross, F Mohn, P Liljeroth, J Repp, FJ Giessibl, G Meyer
Science 324 (5933), 1428-1431, 2009
4252009
A direct method to calculate tip–sample forces from frequency shifts in frequency-modulation atomic force microscopy
FJ Giessibl
Applied Physics Letters 78 (1), 123-125, 2001
4022001
Nanotribology and nanomechanics: an introduction
B Bhushan
Springer, 2008
3192008
The qPlus sensor, a powerful core for the atomic force microscope
FJ Giessibl
Review of scientific instruments 90 (1), 2019
2822019
Revealing the hidden atom in graphite by low-temperature atomic force microscopy
S Hembacher, FJ Giessibl, J Mannhart, CF Quate
Proceedings of the National Academy of Sciences 100 (22), 12539-12542, 2003
2522003
Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy
FJ Giessibl, H Bielefeldt, S Hembacher, J Mannhart
Applied Surface Science 140 (3-4), 352-357, 1999
2471999
Force microscopy with light-atom probes
S Hembacher, FJ Giessibl, J Mannhart
Science 305 (5682), 380-383, 2004
2002004
AFM's path to atomic resolution
FJ Giessibl
Materials Today 8 (5), 32-41, 2005
1982005
Physical interpretation of frequency-modulation atomic force microscopy
FJ Giessibl, H Bielefeldt
Physical Review B 61 (15), 9968, 2000
1942000
Revealing the angular symmetry of chemical bonds by atomic force microscopy
J Welker, FJ Giessibl
Science 336 (6080), 444-449, 2012
1682012
Subatomic resolution force microscopy reveals internal structure and adsorption sites of small iron clusters
M Emmrich, F Huber, F Pielmeier, J Welker, T Hofmann, ...
Science 348 (6232), 308-311, 2015
1632015
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